Title | Autor(en) | Datum |
---|---|---|
RESCAR Publikationen (Stand 19.10.2017) | 2015/05/05 | |
Physical Verification Flow for Hierarchical Analog IC Design Constraints |
Volker Meyer zu Bexten, Infineon Technologies A... Markus Tristl, Infineon Technologies AG, DE Göran Jerke, Robert Bosch GmbH, DE Dina Medhat, Mentor Graphics (Egypt) |
2015/01/20 |
Application of mission profiles to enable cross-domain constraint-driven design |
Carolin Katzschke, Leibniz Universität Hannover... Markus Olbrich, Leibniz Universität Hannover, DE Volker Meyer zu Bexten, Infineon Technologies A... Markus Tristl, Infineon Technologies AG, DE Erich Barke, Leibniz Universität Hannover, DE Marc-Philipp Sohn |
2014/03/26 |
Emulation-Based Robustness Assessment for Automotive Smart-Power ICs |
Thomas Nirmaier, Infineon Technologies AG, DE Christoph Grimm, Rheinland-Pfälzische Technisch... Georg Pelz, Infineon Technologies AG, DE Jérôme Kirscher (Infineon Technologies AG) |
2014/03/25 |
Data Improvement in Lab Verification of Smart Power Products using DoE |
Monica Rafaila, Infineon Technologies AG, DE Georg Pelz, Infineon Technologies AG, DE Andi Buzo (Infineon Technologies AG) Anamaria Oros (Technical University of Cluj-Napoca) Ingrid Kovacs (Technical University of Cluj-Napoca) Marina Topa (Technical University of Cluj-Napoca) |
2013/10/25 |
Quantify Robustness with respect to Specification or Mission Profile |
Thomas Nirmaier, Infineon Technologies AG, DE Manuel Harrant, Infineon Technologies AG, DE Monica Rafaila, Infineon Technologies AG, DE Georg Pelz, Infineon Technologies AG, DE Jerome Kirscher Zhanat Maksut |
2013/03/22 |
Robustness Metrics for Automotive Power Microelectronics |
Thomas Nirmaier, Infineon Technologies AG, DE Manuel Harrant, Infineon Technologies AG, DE Monica Rafaila, Infineon Technologies AG, DE Georg Pelz, Infineon Technologies AG, DE Jerome Kirscher Zhanat Maksut |
2013/03/22 |
Battery Cell Stack Emulation for Battery Management IC Characterization |
Manuel Harrant, Infineon Technologies AG, DE Thomas Nirmaier, Infineon Technologies AG, DE Georg Pelz, Infineon Technologies AG, DE Christoph Grimm, Technische Universität Wien, AT Günter Schwarzberger |
2013/02/24 |
Reliability assessment of safety-relevant automotive systems in a model-based design flow |
Alexander Viehl, FZI Forschungszentrum Informat... Oliver Bringmann, FZI Forschungszentrum Informa... Sebastian Reiter Michael Pressler |
2013/01/25 |
Management of Cross-Domain Constraints | Carolin Katzschke, Leibniz Universität Hannover... | 2012/11/01 |
Complexity, quality and robustness - the challenges of tomorrow's automotive electronics |
Ulrich Abelein, AUDI AG, DE Helmut Lochner, AUDI AG, DE Daniel Hahn, Fraunhofer Institut für Zuverlässi... Stefan Straube, Fraunhofer Institut für Zuverlä... |
2012/03/14 |
Hierarchical Propagation of Geometric Constraints for Full-Custom Physical Design of ICs |
Maximilian Mittag, Robert Bosch GmbH, DE Andreas Krinke, Technische Universität Dresden, DE Göran Jerke, Robert Bosch GmbH, DE |
2012/03/14 |
Robustness Challenges in Automotive Electronics for Electric Vehicles |
Julia Lau, Infineon Technologies AG, DE Ulrich Abelein, AUDI AG, DE Göran Jerke, Robert Bosch GmbH, DE Jörg Breibach, Robert Bosch GmbH, DE Thomas Nirmaier, Infineon Technologies AG, DE |
2012/03/14 |
Measuring and improving the robustness of automotive smart power microelectronics |
Thomas Nirmaier, Infineon Technologies AG, DE Volker Meyer zu Bexten, Infineon Technologies A... Markus Tristl, Infineon Technologies AG, DE Manuel Harrant, Infineon Technologies AG, DE Monica Rafaila, Infineon Technologies AG, DE Julia Lau, Infineon Technologies AG, DE Georg Pelz, Infineon Technologies AG, DE Kunze, M. |
2012/03/14 |
Hierarchische Berücksichtigung geometrischer Constraints im Layoutentwurf von Smart Power ICs |
Maximilian Mittag, Robert Bosch GmbH, DE Göran Jerke, Robert Bosch GmbH, DE |
2011/11/09 |
Extending Constrained Random Verification to mixed-signal Automotive Power Devices using a non-stationary Markov process |
Thomas Nirmaier, Infineon Technologies AG, DE Manuel Harrant, Infineon Technologies AG, DE Georg Pelz, Infineon Technologies AG, DE |
2011/09/22 |
Monte Carlo Algorithm for Compressing Corner Tests |
Thomas Nirmaier, Infineon Technologies AG, DE Georg Pelz, Infineon Technologies AG, DE |
2011/09/22 |
Offset Elimination in Sigma Delta Analog to Digital Converters by fs/2 Modulation | Stephan Bannwarth | 2011/08/31 |
Forschung: robuster Entwurf von Elektronikkomponenten | Gert Reiling | 2011/05/23 |