Measuring and improving the robustness of automotive smart power microelectronics

Authors: Thomas Nirmaier, Infineon Technologies AG, DE; Volker Meyer zu Bexten, Infineon Technologies A...; Markus Tristl, Infineon Technologies AG, DE; Manuel Harrant, Infineon Technologies AG, DE; Monica Rafaila, Infineon Technologies AG, DE; Julia Lau, Infineon Technologies AG, DE; Georg Pelz, Infineon Technologies AG, DE; Kunze, M.



Automotive power micro-electronic devices in the past were low pin-count, low complexity devices. Robustness could be assessed by stressing the few operating conditions and by manual analysis of the simple analog circuitry. Nowadays complexity of Automotive Smart Power Devices is driven by the demands for energy efficiency and safety, which adds the need for additional monitoring circuitry, redundancy, power-modes, leading even to complex System-on-chips with embedded uC cores, embedded memory, sensors and other elements. Assessing the application robustness of this type of microelectronic devices goes hand-in-hand with exploring their verification space inside and to certain extends outside of the specification. While there are well established methods for standard functional verification, methods for application oriented robust verification are not yet available. In this paper we present promising directions and first results, to explore and assess device robustness through various pre- and post-Si verification and design exploration strategies, focusing on metamodeling, constrained-random verification and hardware-in-the-loop experiments, for exploration of the operating space.

Publication Date: 2012/03/14

Location of Publication: Design, Automation & Test in Europe (DATE) 2012, Munich, 12-16 March 2012, Proc. pages 872 - 873

Keyword: Automotive