Quantify Robustness with respect to Specification or Mission Profile

Authors: Thomas Nirmaier, Infineon Technologies AG, DE; Manuel Harrant, Infineon Technologies AG, DE; Monica Rafaila, Infineon Technologies AG, DE; Georg Pelz, Infineon Technologies AG, DE; Jerome Kirscher; Zhanat Maksut

Abstract:

Poster

RIIF Workshop @ Design, Automation and Test Conference 2013, Grenoble

Publication Date: 2013/03/22

Location of Publication: 1st RIIF Workshop @ DATE13, DATE Conference, Grenoble, Frankreich

Keyword: Automotive