REES 2017 Program

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08:45 WELCOME Address
09:00 KEYNOTE Address: Multi-Layer-Resilience: The Need for Discipline
  Speaker: Wolfgang Ecker (Infineon Technology, Germany)
09:30 Session I: Resilient Systems Designs I
I.1 Introducing Fault Tolerance to the Regularity-Based Resource Partition Model
  Darrell Knape, Albert M. K. Cheng, Yu Li (University of Houston, USA)
I.2 Architecting Resilient IoT Systems 
  Kemal A. Delic, David M. Penkler (Hewlett Packard Enterprise, France)
I.3 Utilization of Memristor Variability Towards Brain-Inspired Resilient Computing
  Rawan Naous (King Abdullah University of Science and Technology, Saudi Arabia), Khaled Nabil Salama (The Neuroscience Research Institute, The Ohio State University, USA)
I.4 flexMEDiC: flexible Memory Error Detection by Combined Data Encoding and Duplication
  Norman A. Rink, Jeronimo Castrillo (Technische Universität Dresden, Germany)
10:15 Poster Discussions (Session I) & Refreshments
10:45 Session II: Invited Industrial Talks - Resilient Systems in Practise
II.1 Novel ISO26262 Compliant Architecture for Advanced Driver Assistance Systems
  Speaker: Luc van Dijk (NXP Semiconductors, The Netherlands)
II.2 Design-for-Resiliency in Dynamically Power Managed Systems
  Speaker: Liangzehn Lai (ARM Ltd., UK)
11:45 Session III: Resilient Systems Design II
III.1 Correction of Transient Faults by Rollback with Low Overhead for Microcontrollers
  Felix Mühlbauer (Universität Potsdam, Germany), Mario Schölzel (IHP Frankfurt Oder, Universität Potsdam, Germany)
III.2 Prototyping Resilient Processing Cores in Workcraft
  Georgy Lukyanov (Southern Federal University, Rostov-on-Don, Russia), Alessandro de Gennaro, Andrey Mokhov , Paulius Stankaitis, (Newcastle University, UK) Maxim Rykunov (IMEC, Belgium)
III.3 Increasing the Robustness of Digital Circuits with Ring Oscillator Clocks
  Lucas Machado, Jordi Cortadella, Antoni Roca (UPC, Spain)
12:15 Lunch
13:15 Session IV: Invited Industrial Talks - Resilient Design Tools and Methods
IV.1 Simultaneous Measurement of Defect Coverage and Tolerance in AMS ICs for ISO26262
  Speaker: Stephen Sunter (Mentor Graphics, Canada)
IV.2 Error Effect Simulation for Automotive using SystemC Virtual Prototypes
  Speaker: Andreas Mauderer (Robert Bosch GmbH, Germany)
14:15 Session V: Fault Injection Automation
V.1 An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries
  Peer Adelt (C-LAB, Germany), Bastian Koppelmann (Heinz Nixdorf Institute, Germany), Bernd Kleinjohann (C-LAB, Germany), Christoph Scheytt (Heinz Nixdorf Institute, Germany)
V.2 Revisiting Symbolic Software-implemented Fault Injection
  Hoang M. Le, Vladimir Herdt (University of Bremen, Germany), Daniel Große, Rolf Drechsler (University of Bremen,Cyber-Physical Systems, DFKI GmbH, Germany)
V.3 Constraining Graph-based Test Case Generation by Fitness Landscaping
  Stefan Müller, Jo Laufenberg (University of Tuebingen, Germany), Joachim Gerlach (Hochschule Albstadt-Sigmaringen, Germany), Thomas Kropf, Oliver Bringmann (University of Tuebingen, Germany)
V.4 Closing the Gap Between FMEDA, FTA and Simulation Based Fault Injection at System Level

Adam Himmelsbach, Sebastian Reiter, Alexander Viehl (FZI, Germany), Oliver Bringmann, Wolfgang Rosenstiel (University of Tuebingen, Germany)

15:00 Poster Discussions (Session III+V) & Refreshments
15:30 Session VI: Resilient Circuit Analysis
VI.1 Fault Injection Campaigns in Multi-Domain Virtual Prototypes
  Raghavendra Koppak, Oliver Bringmann (University of Tuebingen, Germany), Andreas von Schwerin (Siemens AG, Germany)
VI.2 Workload Dependent Aged Circuit Reliability Analysis

Ajith Sivadasan, Armelle Notin, Vincent Huard, Etienne Maurin, Florian Cacho (ST Microelectronics), Lorena Anghel (TIMA)

VI.3 SPICE-Level Fault Injection with Likelihood Weighted  Random Sampling - A Case Study
  Liang Wu, Saed Abughannam, Wolfgang Mueller, Christoph Scheytt (Heinz Nixdorf Institute, Germany), Wolfgang Ecker (Infineon Technology, Germany)
VI.4 Resilient Large-Scale Physical Design
  Roman Bazylevych (Lviv Polytechnic National University, Ukraine), Lubov Bazylevych (Institute of Applied Problems of Mechanics and Mathematics NASU, Ukraine)
16:15 Poster Discussions (Session VI)
17:00 End

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