Parachute: Parasitic Extraction and Optimisation for Efficient Microelectronic System Design and Application

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This project addresses the increasing problem of interference that together with the parasitic effects of new IC processes are affecting the reliability of modern electronic systems. Nanometer circuits, microelectronics, microsystem technology and power electronic systems are already part of our daily life. However, these systems encounter many problems with natural and artificial interferences coming from various sources; in terms of Electromagnetic Reliability they are becoming sources and victims of interference themselves. The project aims at improving the Reliability of Applications based on these Electronic Systems.

Project coordination:

Infineon Technologies AG
Dipl.-Ing. Thomas Steinecke
fon: +49 89 234-84979
thomas [dot] steineckeatinfineon [dot] com

Project management:

Fraunhofer-Institut für Elektronische Nanosysteme (ENAS)
Dr. Reinhard Streiter
fon: +49 371 45001-0
reinhard [dot] streiteratenas [dot] fraunhofer [dot] de

Project partners:

Research partners:

Funding initial:

BMBF F&E 01M3169
MEDEA+ 2A701


April 01, 2006 - March 31, 2009


Project Information

Final Report
NL 02 2009 (PKB)
NL 04 2007 (PB)
NL 03 2006 (PN)

Used Abbreviations

PRProject Report
SPRShort Project Report
PNProject News
FPRFinal Project Report