AZTEKE: Application specific test methodology for highly complex systems in automotive and communication applications

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The goal of this project is to increase the design reliability and efficiency of application-specific integrated circuits to assure and improve the competitiveness of the German microelectronics industry. To ensure the reduction of "time to volume", new methodologies and tools for test preparation and design for testability (DFT) are becoming more important to handle the system complexity of future applications. Acquiring qualified and standardized test solutions for modular test of highly complex SoCs is the scope of the project. This will include the development of diagnosis capabilities and fault localization methodologies under timing and performance conditions allowing the test at high frequencies.

Project coordination:

Infineon Technologies AG
Dr.-Ing. Sebastian Sattler

Project partners:

Funding initial:

BMBF F&E 01M3063


March 01, 2002 - February 28, 2005


Project Information

Final Report
Project Flyer (DE)
NL 01 2006 (PSB)
NL 01 2005 (PN)
NL 02 2004 (PB)
NL 01 2004 (PN)
NL 03 2003 (PN)
NL 02 2003 (PN)

Used Abbreviations

PRProject Report
SPRShort Project Report
PNProject News
FPRFinal Project Report