Parachute: Parasitic Extraction and Optimisation for Efficient Microelectronic System Design and Application

This project addresses the increasing problem of interference that together with the parasitic effects of new IC processes are affecting the reliability of modern electronic systems. Nanometer circuits, microelectronics, microsystem technology and power electronic systems are already part of our daily life. However, these systems encounter many problems with natural and artificial interferences coming from various sources; in terms of Electromagnetic Reliability they are becoming sources and victims of interference themselves. The project aims at improving the Reliability of Applications based on these Electronic Systems.

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